Opaque materials characterization requires the reflection spectrometer (shown above). Because the transmitted signal is too small for characterization, a system using 6-axis control is employed to measure the reflected signal. As with the transmission and phase spectrometers the index of refraction, extinction coefficient and the real and imaginary parts of the dielectic function can be quickly calculated from the software’s theoretical fitting capacity.
The transmission, Mach-Zehnder and reflection spectrometers are supported by TScan software, enabling automated data acquisition and analysis. One spectral scan takes 1 – 5 minutes for each of the BWOs employed in the system.
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